Scanning Transmission Electron Microscopy Done Right
نویسندگان
چکیده
Abstract Performance, usability, and even availability of 4D-scanning transmission electron microscopy (STEM) measurements have historically been compromised by the lack integration 4D-STEM components on (S)TEM columns that were not originally designed for this purpose. This article introduces TESCAN TENSOR, world’s first dedicated instrument multimodal characterization nanoscale morphological, chemical, structural properties functional materials, thin films, natural synthetic crystals with stand-out performance unprecedented usability. is method choice nanoscale, material such as morphology, chemistry, structure. At each pixel in STEM dataset, TENSOR rapidly acquires a diffraction pattern an energy dispersive spectroscopy (EDS) spectrum are perfectly synchronized. Together, data encapsulate full picture beam–specimen interaction, from which wide range can be derived. will review analytical applications discuss how new meets these requirements.
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ژورنال
عنوان ژورنال: Microscopy Today
سال: 2023
ISSN: ['2150-3583', '1551-9295']
DOI: https://doi.org/10.1093/mictod/qaad009